Histon, United Kingdom

Brian Gaffney

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Neul Ltd.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Brian Gaffney. Retrieved from https://idiyas.com/inventor/brian-gaffney-mos34qrn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Brian Gaffney: Innovator in Frequency Error Estimation

Introduction

Brian Gaffney is a notable inventor based in Histon, GB. He has made significant contributions to the field of frequency error estimation through his innovative patent. His work is recognized for its practical applications in various technological domains.

Latest Patents

Brian Gaffney holds a patent for a "Method and apparatus for estimating frequency errors." This invention involves determining a frequency error embodied in a series of values by processing selected values with other values in the series. The method generates processed values that maintain a consistent phase component, allowing for the accurate estimation of frequency errors.

Career Highlights

Gaffney is associated with Neul Ltd., where he applies his expertise in frequency estimation. His work has contributed to advancements in technology that rely on precise frequency measurements. With a focus on innovation, he continues to explore new methodologies in his field.

Collaborations

Some of his coworkers include Robert William Young and Robert Young. Their collaboration fosters a creative environment that enhances the development of innovative solutions.

Conclusion

Brian Gaffney's contributions to frequency error estimation exemplify the impact of innovation in technology. His patent reflects a commitment to advancing the field and improving measurement accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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