The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

May. 10, 2013
Applicant:

Neul Ltd., Histon, GB;

Inventors:

Robert Young, Histon, GB;

Brian Gaffney, Histon, GB;

Assignee:

Neul Ltd., Histon, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 56/00 (2009.01); H04L 27/00 (2006.01); H04L 27/26 (2006.01);
U.S. Cl.
CPC ...
H04W 56/0035 (2013.01); H04L 27/0014 (2013.01); H04L 27/266 (2013.01); H04L 27/2655 (2013.01); H04L 27/2657 (2013.01); H04L 27/2659 (2013.01); H04L 2027/0046 (2013.01); H04L 2027/0065 (2013.01); H04L 2027/0095 (2013.01);
Abstract

A frequency error embodied in a series of values is determined by processing each of two or more selected values with another value in the series, each other value being spaced from its respective selected value by a first spacing, to generate processed values that all comprise substantially the same phase component; combining the processed values to generate a combined value that comprises substantially the same phase component as the processed values; repeating the processing and combining with the same selected values but a second spacing, different from the first spacing, to generate a combined value comprising a different phase component from the combined value generated using the first spacing, reflecting the frequency error; and determining the frequency error in dependence on the combined values generated using the first and second spacings.


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