This inventor holds 2 USPTO granted patents. Top assignees: Freescale Semiconductor,inc., Motorola Corporation. Active years: 2002-2004.
Company Filing History:
Years Active: 2002-2004
Title: Brian E Cook: Innovator in Integrated Circuit Technology
Introduction
Brian E Cook is a notable inventor based in Austin, TX, who has made significant contributions to the field of integrated circuits. With a total of 2 patents, his work focuses on enhancing the functionality and reliability of built-in self-test (BIST) controllers in integrated circuits.
Latest Patents
Brian's latest patents include innovative technologies that improve the testing and reliability of memory interfaces. One of his patents, titled "Multiple level built-in self-test controller and method therefor," describes an integrated circuit with a BIST controller that utilizes a sequencer to provide test algorithm information for multiple memories. This technology allows for flexibility in tailoring test algorithms for different memory types while maintaining a single source for identifying the test algorithm. Another patent, "Recording of result information in a built-in self-test circuit and method therefor," also focuses on the BIST controller and its ability to store pertinent information in non-user addressable space of multiple memories when test algorithms fail or complete execution.
Career Highlights
Throughout his career, Brian has worked with prominent companies in the technology sector, including Motorola Corporation and Freescale Semiconductor. His experience in these organizations has allowed him to develop and refine his expertise in integrated circuit design and testing methodologies.
Collaborations
Brian has collaborated with several talented individuals in his field, including James S Ledford and Alex S Yap. These collaborations have contributed to the advancement of technology in integrated circuits and memory testing.
Conclusion
Brian E Cook is a distinguished inventor whose work in integrated circuit technology has led to significant advancements in built-in self-test methodologies. His contributions continue to influence the field and enhance the reliability of electronic devices.