Chelsea, MI, United States of America

Brian D Colesa


Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Innovations of Brian D Colesa in X-ray Imaging Technology

Introduction

Brian D Colesa is an accomplished inventor based in Chelsea, MI (US). He has made significant contributions to the field of imaging technology, particularly with his innovative approach to measuring the area density of low-density materials. His work has implications in various industries, enhancing the accuracy and efficiency of material analysis.

Latest Patents

Brian D Colesa holds a patent for an "X-ray imaging system for determining area density of low density samples." This invention involves an apparatus and method for measuring the area density of low-density material samples. The system features an x-ray emitter that emits x-rays in the range of 3 kilovolts to 20 kilovolts, allowing the x-rays to pass through the sample. An imaging device then converts the x-rays that pass through the sample into visible light, producing a visible image that varies in intensity based on the area density across the sample. A camera captures the intensity of this visible image, while a computer processor analyzes the output signal from the camera after digitization, providing a detailed analysis of the sample's area density. Brian holds 1 patent.

Career Highlights

Brian D Colesa is currently employed at Pilot Industries, Inc., where he continues to develop and refine his innovative technologies. His work at the company has positioned him as a key player in advancing imaging systems that are crucial for various applications.

Collaborations

Brian has collaborated with notable colleagues, including Charles J Armentrout and Thomas J Basinger. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Brian D Colesa's contributions to x-ray imaging technology exemplify the impact of innovation in material analysis. His patent for an x-ray imaging system showcases his commitment to advancing the field and improving measurement techniques.

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