Pilot Industries, Inc.

Brian D Colesa

Charles J Armentrout

David Sullivan

James H Beyer

Thomas J Basinger

Carl E Strandberg

Paul C Olsztyn

Karen G Smith

An apparatus and method are disclosed for measuring the area density of a low density material sample. The system includes an x-ray emitter which emits x-rays in the range of 3 kilovolts to 20 kilovolts and the x-rays pass through the sample. An imaging device converts the x-rays which pass through the sample to visible light to produce a visible image corresponding to the sample and in which the visible image has an intensity which varies as a function of the area density across the sample. A camera produces an output signal representative of the intensity of the visible image across the sample while a computer processor processes the signal from the camera after digitization to produce an analysis of the area density of the sample.

X-ray imaging system for determining area density of low density samples

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Chelsea, MI, United States of America

Brian D Colesa