The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2000
Filed:
May. 12, 1999
Charles J Armentrout, Ann Arbor, MI (US);
Thomas Basinger, Ypsilanti, MI (US);
James H Beyer, Ann Arbor, MI (US);
Brian D Colesa, Chelsea, MI (US);
Paul Olsztyn, Ann Arbor, MI (US);
Karen G Smith, Brighton, MI (US);
Carl Strandberg, Troy, MI (US);
David Sullivan, Brighton, MI (US);
Pilot Industries, Inc., Dexter, MI (US);
Abstract
An apparatus and method are disclosed for measuring the area density of a low density material sample. The system includes an x-ray emitter which emits x-rays in the range of 3 kilovolts to 20 kilovolts and the x-rays pass through the sample. An imaging device converts the x-rays which pass through the sample to visible light to produce a visible image corresponding to the sample and in which the visible image has an intensity which varies as a function of the area density across the sample. A camera produces an output signal representative of the intensity of the visible image across the sample while a computer processor processes the signal from the camera after digitization to produce an analysis of the area density of the sample.