Brett W Attaway

Title: Brett W Attaway: Innovator in Integrated Circuit Testing

Introduction

Brett W Attaway is a notable inventor based in Orlando, FL (US). He has made significant contributions to the field of integrated circuit testing, holding 2 patents that showcase his innovative approach to technology.

Latest Patents

One of Brett's latest patents is titled "Fast BIST Architecture with Flexible Standard Interface." This invention presents a built-in self-test architecture designed for testing one or more integrated circuits. Each circuit is equipped with an interface that complies with IEEE standard 1149.1, along with scan registers containing scan cells. These components facilitate the supply of input test data and the reception of output test data from the internal circuitry of the integrated circuits. Additionally, the architecture includes a pseudo-random pattern generator that provides patterns of test data to the boundary scan register, as well as a pattern compressor that compresses the output test data into a signature. A single clock multiplexer, located externally to the integrated circuits, selectively supplies either a system clock or a test clock to the testing components of each integrated circuit.

Career Highlights

Brett W Attaway is currently employed at Lockheed Martin Corporation, where he continues to develop innovative solutions in the field of integrated circuits. His work has significantly impacted the efficiency and reliability of testing methodologies in the industry.

Collaborations

Brett has collaborated with notable coworkers such as John D Lofgren and H Ray Kelley, contributing to a dynamic and innovative work environment.

Conclusion

Brett W Attaway's contributions to integrated circuit testing through his patents and work at Lockheed Martin Corporation highlight his role as a key innovator in the field. His inventions continue to advance the technology used in integrated circuits, ensuring better performance and reliability.