The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 1999
Filed:
Aug. 21, 1997
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A built-in self test architecture for testing one or more integrated circuits. Each circuit is provided with an interface compatible with IEEE standard 1149.1 and one or more scan registers containing scan cells for supplying input test data to, and receiving output test data from, the internal circuitry of the integrated circuits, a pseudo-random pattern generator for supplying patterns of test data to the boundary scan register, and a pattern compressor for compressing the output test data into a signature. The architecture also includes a single clock multiplexer, located external to the integrated circuits, for selectively supplying a system clock or a test clock to the testing components of each integrated circuit.