Clayton, NC, United States of America

Brett Farina

This inventor holds 1 USPTO granted patent. Top assignee: Sas Institute Inc.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Brett Farina. Retrieved from https://idiyas.com/inventor/brett-farina

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations of Brett Farina

Introduction

Brett Farina is an accomplished inventor based in Clayton, NC (US). He has made significant contributions to the field of measurement data analysis through his innovative patent. His work focuses on enhancing the accuracy and reliability of data received from measurement devices.

Latest Patents

Brett Farina holds a patent for "Techniques for multi-stage analysis of measurement data with event stream processing." This patent is directed towards systems for multi-stage measurement data analysis (MMDA). The technology aims to evaluate and validate data from measurement devices, providing near real-time validation by detecting losses in the measurement data. The MMDA system can identify both technical losses, such as equipment malfunctions, and non-technical losses, like compromised equipment. For instance, it can determine if an electrical meter is malfunctioning by analyzing the measurement data for technical losses.

Career Highlights

Brett Farina is currently employed at SAS Institute Inc., where he applies his expertise in measurement data analysis. His innovative approach has positioned him as a key player in the development of advanced data validation systems. With a focus on real-time data processing, he continues to push the boundaries of technology in his field.

Collaborations

Brett has collaborated with notable colleagues, including David Pope and Blanden Scott Chisum. Their combined efforts contribute to the advancement of measurement data analysis technologies.

Conclusion

Brett Farina's contributions to the field of measurement data analysis through his patent demonstrate his commitment to innovation and technology. His work not only enhances data validation processes but also sets a foundation for future advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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