The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Jun. 04, 2018
Sas Institute Inc., Cary, NC (US);
David Carter Pope, Raleigh, NC (US);
Blanden Scott Chisum, Apex, NC (US);
Brett Farina, Clayton, NC (US);
Mark Joseph Konya, Chesterfield, MO (US);
SAS INSTITUTE INC., Cary, NC (US);
Abstract
Various embodiments are generally directed to systems for multi-stage measurement data analysis (MMDA), such as for evaluation and/or validation of data received from a measurement device, for instance. Some embodiments are particularly directed to a MMDA system that utilizes event stream processing (ESP) to provide near real-time validation of measurement data, at least in part, by detecting losses in the measurement data. In many embodiments, the MMDA system may detect technical losses (e.g., due to equipment malfunction) and/or non-technical losses (e.g., due to compromised equipment). For example, the MMDA system may receive measurement data generated by an electrical meter and determine the electrical meter is malfunctioning by detecting a technical loss in the measurement data. In many embodiments, the MMDA system may utilize both direct and indirect measurement data transmitted via separate communication paths to provide near real-time validation of measurement data.