Company Filing History:
Years Active: 2009-2011
Title: **Brett Allen Pawlanta: Innovator in Surface Measurement Technologies**
Introduction
Brett Allen Pawlanta is a notable inventor based in Grand Rapids, MI, USA, recognized for his contributions to measuring the appearance properties of surfaces. With a total of three patents to his name, Pawlanta has developed innovative solutions that enhance the understanding of surface interactions with light, which are crucial in various industrial applications.
Latest Patents
Pawlanta's latest patents focus on the Bidirectional Reflectance Distribution Function (BRDF), a technical method used to measure how light interacts with surfaces. His first patent details an apparatus designed to measure a spatially under-sampled BRDF of a surface. This apparatus includes a first light source that illuminates the surface from a specific direction and a series of sensors that capture light reflected from the surface in multiple non-coplanar directions. The sensors work in conjunction with a computer system that processes the data, allowing for the accurate conversion of the light measurements into valuable appearance properties of the surface.
Career Highlights
Brett is currently employed at X-Rite GmbH, a company renowned for its expertise in color management solutions. Throughout his career, Pawlanta has demonstrated a commitment to advancing measurement technologies, particularly in the fields of optics and material science. His inventions have not only contributed to the knowledge base in these areas but have also provided practical applications that improve product quality and consistency.
Collaborations
In his path of innovation, Pawlanta has collaborated with talented colleagues, including Jon Nisper and Patrick S. Rood. These partnerships have fostered a productive environment that encourages creativity and the sharing of ideas, ultimately leading to successful patent developments and enhanced technological solutions.
Conclusion
Brett Allen Pawlanta stands out as a dedicated inventor who is significantly impacting the field of surface measurement technologies. With his innovative patents and collaborative spirit, he continues to advance the methodologies in which we understand and measure surface properties, promising exciting prospects for future developments in this domain.