X-rite Gmbh

Brett Allen Pawlanta

Jon Nisper

Thomas Richardson

Patrick S Rood

Brian Dale Teunis

Timothy L Walker

Thomas W Michaels

Kraig D Spear

James W Vogh

Jon Kenneth Nisper

An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.

Measuring an appearance property of a surface using a bidirectional reflectance distribution function

Measuring an appearance property of a surface using a spatially under-sampled bidirectional reflectance distribution function

A method for adjusting a color measurement of a secondary color measurement instrument. The method includes generating a profile for the secondary color measurement instrument based on color measurements of a master color measurement instrument, and applying the profile to adjust the color measurement of the secondary color measurement instrument.

Systems and methods for profiling and synchronizing a fleet of color measurement instruments

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Grand Rapids, MI, United States of America

Brett Allen Pawlanta