The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2009

Filed:

Jun. 12, 2006
Applicants:

Brett Allen Pawlanta, Grand Rapids, MI (US);

James W. Vogh, Methuen, MA (US);

Thomas W. Michaels, Grand Rapids, MI (US);

Kraig D. Spear, Grand Rapids, MI (US);

Timothy L. Walker, West Olive, MI (US);

Inventors:

Brett Allen Pawlanta, Grand Rapids, MI (US);

James W. Vogh, Methuen, MA (US);

Thomas W. Michaels, Grand Rapids, MI (US);

Kraig D. Spear, Grand Rapids, MI (US);

Timothy L. Walker, West Olive, MI (US);

Assignee:

X-Rite, Inc., Grand Rapids, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for adjusting a color measurement of a secondary color measurement instrument. The method includes generating a profile for the secondary color measurement instrument based on color measurements of a master color measurement instrument, and applying the profile to adjust the color measurement of the secondary color measurement instrument.


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