Dayton, OH, United States of America

Brent Foy

This inventor holds 1 USPTO granted patent. Top assignee: Wright State University. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Brent Foy. Retrieved from https://idiyas.com/inventor/brent-foy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Brent Foy: Innovator in Evanescent Microwave Microscopy

Introduction

Brent Foy is a notable inventor based in Dayton, OH (US). He has made significant contributions to the field of microscopy through his innovative work. His research focuses on developing advanced methodologies that enhance the capabilities of existing technologies.

Latest Patents

Brent Foy holds a patent for an evanescent microwave microscopy probe and methodology. This patent describes a probe constructed of silver, which is designed to measure unknown properties of target materials. The methodology involves moving the probe away from the target material to take a first measurement, then touching the target material to take a second measurement, and finally comparing the two measurements to determine the unknown property.

Career Highlights

Brent Foy is affiliated with Wright State University, where he continues to advance his research and contribute to the academic community. His work has garnered attention for its innovative approach to microscopy, which has potential applications in various scientific fields.

Collaborations

Brent collaborates with esteemed colleagues, including Richard A Kleismit and Barbara E Hull. Their combined expertise enhances the research environment and fosters innovation within their projects.

Conclusion

Brent Foy's contributions to the field of evanescent microwave microscopy exemplify the spirit of innovation. His work not only advances scientific understanding but also paves the way for future developments in microscopy technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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