The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2014
Filed:
Jun. 26, 2009
Richard A. Kleismit, Dayton, OH (US);
Barbara E. Hull, Dayton, OH (US);
Gregory Kozlowski, Dayton, OH (US);
Brent Foy, Dayton, OH (US);
Richard A. Kleismit, Dayton, OH (US);
Barbara E. Hull, Dayton, OH (US);
Gregory Kozlowski, Dayton, OH (US);
Brent Foy, Dayton, OH (US);
Wright State University, Dayton, OH (US);
Abstract
The present disclosure generally relates to an evanescent microwave microscopy probe and methods for making and using the same. Some embodiments relate to a probe which is constructed of silver. Other embodiments relate to a method of measuring an unknown property a target material, comprising moving the probe away from the target material, taking a first measurement, moving the probe such that it touches the target material, taking a second measurement, and comparing the first and second measurements in order to measure the unknown property.