Company Filing History:
Years Active: 2015-2024
Title: Brandon Van Leer: Innovator in Charged Particle Microscopy
Introduction
Brandon Van Leer is a notable inventor based in Cornelius, OR (US). He has made significant contributions to the field of charged particle microscopy, holding 2 patents that showcase his innovative approaches to handling highly reactive materials.
Latest Patents
One of his latest patents is titled "Systems and methods for performing sample lift-out for highly reactive materials." This patent discloses methods and systems for performing sample lift-out and protective cap placement within charged particle microscopy systems. The methods include preparing a nesting void in a support structure, translating a portion of a sample into the nesting void, and milling material from the support structure to form an attachment bond between the sample and the structure. This innovative approach allows for further investigation of the sample using techniques such as serial sectioning tomography, enhanced insertable backscatter detector analysis, and electron backscatter diffraction analysis.
Another significant patent by Van Leer is "Scanning microscope having an adaptive scan." This method involves using a scanning microscope to rapidly form a digital image of an area. It includes performing an initial set of scans to create a guide pixel set, which helps identify regions of interest. Additional scans are then performed on these regions to gather further data, enhancing the evaluation of pixels without unnecessary scanning of other areas.
Career Highlights
Brandon Van Leer is currently associated with FEI Company, where he continues to push the boundaries of innovation in microscopy. His work has been instrumental in developing advanced techniques that improve the efficiency and accuracy of sample analysis.
Collaborations
Throughout his career, Van Leer has collaborated with talented individuals such as Cliff Bugge and Adam Stokes. These collaborations have fostered an environment of creativity and innovation, leading to groundbreaking advancements in their field.
Conclusion
Brandon Van Leer stands out as a prominent inventor in the realm of charged particle microscopy. His patents reflect a deep understanding of the complexities involved in working with highly reactive materials. His contributions continue to influence the field and inspire future innovations.