Brandon Liew

Title: Brandon Liew - Innovator in Probe Head Assemblies

Introduction

Brandon Liew is a notable inventor based in Beaverton, OR (US). He has made significant contributions to the field of integrated circuit testing through his innovative designs and patents. His work focuses on enhancing the efficiency and effectiveness of probe systems used in the semiconductor industry.

Latest Patents

Brandon Liew holds a patent for "Probe head assemblies and probe systems for testing integrated circuit devices." This patent describes various embodiments of probe head assemblies that include a contacting structure, a suspension system, and a space transformer assembly. The designs aim to improve the functionality of probe systems, which are essential for testing integrated circuit devices. His patent includes features such as a flex cable interface and a planarization layer, which enhance the performance of the probe head assemblies.

Career Highlights

Brandon Liew is currently employed at FormFactor Beaverton, Inc., where he continues to innovate in the field of semiconductor testing. His work has led to advancements that benefit the industry and improve testing accuracy. With a focus on practical applications, he has successfully developed solutions that address the challenges faced in integrated circuit testing.

Collaborations

Brandon collaborates with talented individuals such as Jay Scott Salmon and Roy Swart. These partnerships foster a creative environment that encourages the development of cutting-edge technologies in the semiconductor sector.

Conclusion

Brandon Liew is a dedicated inventor whose work in probe head assemblies has made a significant impact on the semiconductor testing industry. His innovative designs and collaborative efforts continue to drive advancements in technology.