San Francisco, CA, United States of America

Boyi Ma

This inventor holds 1 USPTO granted patent. Top assignee: Ouster, Inc.. Active years: 2025.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Boyi Ma - Innovator in LIDAR Technology

Introduction

Boyi Ma is a notable inventor based in San Francisco, CA. He has made significant contributions to the field of optical measurement systems, particularly in LIDAR technology. His innovative approach has led to the development of a unique patent that enhances the efficiency of LIDAR measurements.

Latest Patents

Boyi Ma holds a patent for "Configurable memory blocks for LIDAR measurements." This optical measurement system includes a plurality of light sources and photosensors. The photosensors are designed to receive photons from the light sources that are reflected off objects in the surrounding environment. Photons are stored in memory blocks corresponding to the photosensors to form histograms of the received photons. A select circuit is utilized to share memory blocks between photosensors, allowing multiple photosensors to write to a single memory block or a single photosensor to write to several memory blocks. Additionally, the sampling clock cycles for the photosensors can be adjusted relative to the clock cycles for the memory blocks based on the select circuit output.

Career Highlights

Boyi Ma is currently employed at Ouster, Inc., where he continues to innovate in the field of LIDAR technology. His work has positioned him as a key player in the advancement of optical measurement systems.

Collaborations

Boyi collaborates with talented individuals such as Angus Pacala and Yan Zhao, who contribute to the innovative environment at Ouster, Inc.

Conclusion

Boyi Ma's contributions to LIDAR technology through his patent and work at Ouster, Inc. highlight his role as a significant inventor in the field. His innovative solutions are paving the way for advancements in optical measurement systems.

Profile summary based on public USPTO records.
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