The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Oct. 20, 2021
Applicant:

Ouster, Inc., San Francisco, CA (US);

Inventors:

Angus Pacala, San Francisco, CA (US);

Yan Zhao, San Francisco, CA (US);

Boyi Ma, San Francisco, CA (US);

Marvin Shu, San Francisco, CA (US);

Assignee:

Ouster, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/93 (2020.01); G01S 7/481 (2006.01); G01S 17/36 (2006.01); G01S 17/42 (2006.01); G06F 13/16 (2006.01);
U.S. Cl.
CPC ...
G01S 17/93 (2013.01); G01S 7/4817 (2013.01); G01S 17/36 (2013.01); G01S 17/42 (2013.01); G06F 13/1673 (2013.01); G06F 13/1689 (2013.01);
Abstract

An optical measurement system may include a plurality of light sources and a plurality of photosensors, where the photosensors are configured to receive photons from the light sources that are reflected off objects in the surrounding environment. Photons may be stored in memory blocks corresponding to the photosensors to form histograms of the receive photons. A select circuit may be used to share memory blocks between photosensors, such that a plurality of photosensors may write to a single memory block, or a single photosensor may write to a plurality of memory blocks. Sampling clock cycles for the photosensors may be adjusted relative to the clock cycles for the memory blocks based on the select circuit output.


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