Company Filing History:
Years Active: 2025
Title: Bo Xiong - Innovator in Noise Diagnostics for Electron Beam Inspection Systems
Introduction
Bo Xiong is a notable inventor based in Milpitas, CA (US). He has made significant contributions to the field of electron beam inspection systems. His innovative work focuses on noise diagnostics, which is crucial for enhancing the accuracy and reliability of inspection processes.
Latest Patents
Bo Xiong holds a patent for "Noise diagnostics for an electron beam inspection system with swathing." This patent addresses the determination of parameters from an inspection image that represent mechanical vibrations and electromagnetic interference. Specifically, it allows for the calculation of an X-direction vibration spectrum based on X-direction offsets and a Y-direction vibration spectrum based on Y-direction offsets. These determinations can be derived from a swath image of a workpiece, such as a semiconductor wafer or reticle. He has 1 patent to his name.
Career Highlights
Bo Xiong is currently employed at Kla Corporation, a leading company in the field of semiconductor inspection and metrology. His work at Kla Corporation has positioned him as a key player in advancing technologies that improve inspection methodologies.
Collaborations
Throughout his career, Bo has collaborated with talented individuals such as Hedong Yang and Kay Wang. These collaborations have contributed to the development of innovative solutions in the field of electron beam inspection.
Conclusion
Bo Xiong's contributions to noise diagnostics in electron beam inspection systems highlight his innovative spirit and dedication to advancing technology. His work continues to impact the semiconductor industry positively.