Bixi Yan

Title: Bixi Yan - Innovator in Photogrammetry Systems

Introduction

Bixi Yan is a prominent inventor based in Beijing, China. He has made significant contributions to the field of photogrammetry, particularly in the development of methods that enhance the precision of orientation in dynamic systems. His innovative approach has the potential to improve various applications in imaging and measurement.

Latest Patents

Bixi Yan holds a patent for a method titled "Method for implementing high-precision orientation and evaluating orientation precision of large-scale dynamic photogrammetry system." This invention outlines a systematic approach that includes selecting a scale bar, arranging code points, and performing length measurements. The method also involves dividing measurement spaces, utilizing cameras for photography, and applying self-calibration techniques to ensure accuracy. This patent effectively addresses the challenge of reducing relative errors in length measurement, showcasing Yan's expertise in the field.

Career Highlights

Bixi Yan is affiliated with Beijing Information Science & Technology University, where he contributes to research and development in photogrammetry. His work is characterized by a commitment to advancing technology and improving measurement techniques. With a focus on high-precision systems, Yan has established himself as a key figure in his area of expertise.

Collaborations

Bixi Yan has collaborated with notable colleagues, including Mingli Dong and Peng Sun. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas within the field.

Conclusion

Bixi Yan's contributions to photogrammetry through his patented methods highlight his role as an influential inventor. His work not only advances technology but also sets a foundation for future innovations in measurement systems.