Company Filing History:
Years Active: 2025
Title: Bindi M Nagda: Innovator in Semiconductor Measurement Technologies
Introduction
Bindi M Nagda is a prominent inventor based in Melbourne, FL (US). She has made significant contributions to the field of semiconductor measurement technologies. With a total of 2 patents, her work focuses on optimizing measurement processes to enhance efficiency and accuracy.
Latest Patents
Bindi's latest patents include innovative methods for X-ray scatterometry measurements. The first patent, titled "Forward library based seeding for efficient X-ray scatterometry measurements," describes systems for performing X-ray model-based scatterometry measurements of semiconductor structures. This invention reduces computational effort by transforming measured detector image data into diffraction order efficiency data. By comparing this data with a parameter-efficiency library, Bindi's method allows for the selection of seed values that enable image-based regression to converge to the global minimum with fewer iterations. This advancement leads to accurate X-ray scatterometry measurements of complex semiconductor structures with significantly less computational effort.
The second patent, "Methods and systems for regularizing the optimization of application-specific semiconductor measurement system parameter settings," focuses on optimizing semiconductor measurement recipes. This invention minimizes a cost function that includes regularization terms, thereby reducing the computational effort required for optimization. By validating the performance of measurement recipes using existing data, Bindi's work enhances wafer throughput and reduces overall process time.
Career Highlights
Bindi M Nagda is currently employed at Kla Corporation, where she continues to innovate in the semiconductor measurement field. Her expertise and contributions have positioned her as a key figure in her organization.
Collaborations
Bindi has collaborated with notable coworkers, including Christopher Liman and Antonio Arion Gellineau. These partnerships have further enriched her work and expanded the impact of her inventions.
Conclusion
Bindi M Nagda is a trailblazer in semiconductor measurement technologies, with her patents reflecting her commitment to innovation and efficiency. Her contributions are vital to advancing the field and improving measurement processes in semiconductor manufacturing.