Company Filing History:
2 out of 46 
1 out of 641 
1 out of 832,843 Years Active: 1996-2007
Title: Innovations of Bin-Ming Ben Tsai
Introduction
Bin-Ming Ben Tsai is a notable inventor based in San Jose, CA (US). He has made significant contributions to the field of defect detection in digitized device images. With a total of 4 patents to his name, his work showcases a blend of technical expertise and innovative thinking.
Latest Patents
One of his latest patents is an inspection method and apparatus for the inspection of either random or repeating patterns. This invention employs a hybrid technique for identifying defects on digitized device images by utilizing a combination of spatial domain and frequency domain techniques. The process involves finding the two-dimensional spectra of two images using Fourier-like transforms. Strong harmonics in the spectra are removed with the same spectral filter applied to both spectra. The images are then aligned, transformed back to the spatial domain, and subtracted. The resulting spectrally-filtered difference image is thresholded and analyzed for defects. This hybrid technique results in a high-performance and flexible defect detection system, excelling in both array and random devices. It effectively addresses challenges such as shading variations and the dark-bright problem, which are often difficult for other techniques to manage. Additionally, the method uses frequency domain techniques to align images with fewer errors compared to spatial domain techniques of similar complexity. The relative offsets of the image pairs are determined by frequency domain techniques, making this method both accurate and cost-effective.
Career Highlights
Throughout his career, Bin-Ming Ben Tsai has worked with notable companies, including Kla Instruments Corporation. His experience in these organizations has contributed to his expertise in the field of image inspection and defect detection.
Collaborations
He has collaborated with professionals such as Jason Z Lin and David M Evans, further enhancing his innovative capabilities and contributions to the industry.
Conclusion
Bin-Ming Ben Tsai's work in developing advanced inspection methods has significantly impacted the field of defect detection in digitized images. His innovative techniques continue to set new standards for performance and flexibility in the industry.