Bin Abdulrashid Fariz

Title: Bin Abdulrashid Fariz: Innovator in Optical Inspection Technology

Introduction

Bin Abdulrashid Fariz is a notable inventor based in Kamisato, Japan. He has made significant contributions to the field of optical inspection technology. His innovative approach has led to the development of a unique method capable of detecting finer defects on substrate surfaces.

Latest Patents

Fariz holds a patent for an "Optical inspection method and its apparatus." This invention provides a sophisticated optical inspection method that can detect minute defects on the surface of a substrate. The method involves several steps, including irradiating a rotating sample surface with illumination light at an oblique angle. It also includes detecting images formed by forward scattering light while excluding regular-reflection light. Additionally, the method condenses and detects lateral scattering light to extract defects, including scratches.

Career Highlights

Fariz is associated with Hitachi High-Technologies Corporation, where he applies his expertise in optical inspection technology. His work has been instrumental in advancing the capabilities of inspection methods used in various industries.

Collaborations

Fariz has collaborated with notable colleagues, including Shigeru Serikawa and Keiji Kato. Their combined efforts have contributed to the development of innovative technologies in the field.

Conclusion

Bin Abdulrashid Fariz is a distinguished inventor whose work in optical inspection technology has paved the way for advancements in defect detection methods. His contributions continue to impact the industry positively.