Mons, France

Bill Woodley

This inventor holds 1 USPTO granted patent. Top assignees: Institut Francais Du Pe'trole, Sematech, Inc.. Active years: 1996.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Bill Woodley: Innovator in Luminous Intensity Measurement

Introduction

Bill Woodley is a notable inventor based in Mons, France. He has made significant contributions to the field of optical measurement, particularly in the analysis of thin films. His innovative work has led to the development of a unique device that enhances the understanding of colloidal media.

Latest Patents

Woodley's most recent patent is titled "Detector for measuring the luminous intensity scattered by thin films." This invention relates to a device designed to measure the luminous intensity scattered by thin films of colloidal media. It is particularly aimed at submicron grain-size analysis through photon correlation. The device includes a monochromatic luminous source, a converging optical system that focuses the source on the thin film to be analyzed, and at least one photosensitive detector that captures the light scattered or backscattered by the thin film. Additionally, it features a system for processing the signals from the photodetectors.

Career Highlights

Throughout his career, Bill Woodley has worked with prominent organizations such as the Institut Français du Pétrole and Sematech, Inc. His experience in these companies has allowed him to refine his skills and contribute to significant advancements in optical measurement technologies.

Collaborations

Woodley has collaborated with notable colleagues, including Frank Pinier and Patrick Patin. Their combined expertise has fostered an environment of innovation and creativity in their respective fields.

Conclusion

Bill Woodley is a distinguished inventor whose work in measuring luminous intensity has paved the way for advancements in the analysis of thin films. His contributions continue to influence the field of optical measurement, showcasing the importance of innovation in scientific research.

Profile summary based on public USPTO records.
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