The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 1996
Filed:
Nov. 23, 1994
Frank Pinier, Cagnes S/Mer, FR;
Bill Woodley, Mons, FR;
Patrick Patin, Nice, FR;
Didier Frot, Choisy le Roi, FR;
Institut Francais du Petrole, Rueil-Malmaison, FR;
Sematech, Nice, FR;
Abstract
The present invention relates to a device for measuring the luminous intensity scattered by thin films of colloidal media. It is more particularly intended for submicron grain-size analysis by photon correlation, and comprises a device for measuring the luminous intensity scattered by thin films (16) of colloidal media. The invention includes a monochromatic luminous source (2); a converging optical system (4) focusing the source on the thin film to be analyzed; at least one photosensitive detector (5; 5'; 5'; 5'') detecting the light scattered or backscattered by the thin film; and a system (60, 70) for processing the signal coming from photodetector(s) (5).