This inventor holds 2 USPTO granted patents. Top assignee: Nordson Corporation. Active years: 2022-2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022-2025
Title: Bill Walker - Innovator in X-ray Inspection Technology
Introduction
Bill Walker is a notable inventor based in Aylesbury, GB. He has made significant contributions to the field of x-ray inspection technology. With a total of 2 patents, his work focuses on enhancing the efficiency and effectiveness of x-ray imaging systems.
Latest Patents
Walker’s latest patents include an innovative x-ray inspection system and an x-ray imaging accessory. The x-ray inspection system comprises an x-ray source, an x-ray detector, and a sample support made of pliable material. This sample support is designed to securely clamp a sample for inspection, ensuring that at least one surface of the sample is in contact with the pliable material. The system also features a sample support positioning assembly that allows for the rotation of the sample, enabling the capture of a series of two-dimensional images. These images can then be used to create a three-dimensional reconstruction of the sample. Additionally, he has developed ionizing radiation shielding panels, which consist of a core layer made from radiation attenuation material, such as barite, and are designed for use in x-ray inspection apparatus.
Career Highlights
Bill Walker is currently employed at Nordson Corporation, where he continues to innovate in the field of x-ray technology. His work has been instrumental in advancing the capabilities of x-ray inspection systems, making them more versatile and effective.
Collaborations
Walker collaborates with David Sutton, contributing to the development of cutting-edge technologies in their field.
Conclusion
Bill Walker's contributions to x-ray inspection technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in x-ray imaging and radiation shielding.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
