The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Jun. 08, 2021
Nordson Corporation, Westlake, OH (US);
Bill Walker, Suffolk, GB;
David Sutton, Essex, GB;
Nordson Corporation, Westlake, OH (US);
Abstract
An x-ray inspection system comprising an x-ray source, an x-ray detector, a sample support comprising a pliable material and a sample support positioning assembly configured to position the sample support between the x-ray source and the x-ray detector. The sample support is configured to removably clamp a sample for inspection in a fixed position with respect to the sample support and configured so that, in use, at least one surface of the sample is in contact with the pliable material. The sample support positioning assembly comprises a rotational drive configured to rotate the sample support about a rotational axis. This allows the sample to be rotated about a rotational axis such that a series of two-dimensional images can be captured by the x-ray detector that can be used to create a three-dimensional reconstruction of the sample.