This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2005.
Company Filing History:
Years Active: 2005
Title: Innovations by Bibo Chen in Embedded Memory Testing
Introduction
Bibo Chen is an accomplished inventor based in Missouri City, TX (US). He has made significant contributions to the field of embedded memory testing, showcasing his expertise through his innovative patent.
Latest Patents
Bibo Chen holds a patent for a "CPU-based system and method for testing embedded memory." This invention employs the on-chip CPU itself to test embedded memory. An assembly code program is loaded into the device under test (DUT) to evaluate the memories, determine a repair solution, and document the repair solution along with raw failure information for defect analysis. The testing process is driven by an external programmable clock provided by the tester, allowing the DUT to operate at its maximum input clock rate to maximize throughput. Notably, the test is independent of the pattern rate of the tester.
Career Highlights
Bibo Chen is associated with Texas Instruments Corporation, a leading company in the semiconductor industry. His work has contributed to advancements in memory testing technologies, enhancing the efficiency and reliability of embedded systems.
Collaborations
Bibo has collaborated with notable colleagues, including Nicholas H Schutt and James Michael Jarboe, Jr. Their combined expertise has fostered innovation in their respective fields.
Conclusion
Bibo Chen's contributions to embedded memory testing through his innovative patent reflect his dedication to advancing technology. His work at Texas Instruments Corporation continues to influence the industry positively.