The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2005

Filed:

Apr. 30, 2002
Applicants:

Nicholas H. Schutt, Sugar Land, TX (US);

James M. Jarboe, Jr., Allen, TX (US);

Bibo Chen, Missouri City, TX (US);

Inventors:

Nicholas H. Schutt, Sugar Land, TX (US);

James M. Jarboe, Jr., Allen, TX (US);

Bibo Chen, Missouri City, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F011/00 ;
U.S. Cl.
CPC ...
Abstract

A CPU-based systemand method for testing embedded memory. The technique employs the on-chip CPUitself to test the embedded memoryAn assembly code program is loaded into the device under test (DUT)to test the memories, determine a repair solution, and write out the repair solution and raw failure information to the tester for defect analysis. The test is driven by an external programmable clock that is provided by the tester to allow the DUTto run up to its maximum input clock rate in order to maximize throughput. The test is not dependent on the pattern rate of the tester.


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