Taoyuan, Taiwan

Bi-Jen Chen


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017-2019

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2 patents (USPTO):Explore Patents

Title: Bi-Jen Chen: Innovator in Fault Isolation Systems

Introduction

Bi-Jen Chen is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of integrated circuits, particularly in fault detection and isolation systems. With a total of 2 patents, his work has advanced the technology used in diagnosing errors within electronic circuits.

Latest Patents

One of Bi-Jen Chen's latest patents is a fault isolation system and method for detecting faults in a circuit. This invention provides a method and a fault isolation system for detecting errors in an integrated circuit. A key feature of this invention is the use of a movable second probe to scan and acquire an output signal through the vias or metal line structure of a diagnostic area along a detecting line. This allows for precise identification of fault locations. Additionally, the invention employs a cutter in conjunction with the scanning method to narrow down the fault range. The cutter electrically isolates portions of the diagnostic area step by step, facilitating a more efficient approach to locating faults. This innovative method significantly reduces analysis time and enables the localization of minor faults.

Career Highlights

Bi-Jen Chen is currently associated with Micron Technology Incorporated, where he continues to develop cutting-edge technologies in the field of electronics. His expertise in fault detection systems has positioned him as a valuable asset to the company.

Collaborations

Bi-Jen Chen has collaborated with several talented individuals in his field, including Wei-Chih Wang and Hua-Sheng Chen. These collaborations have further enriched his work and contributed to advancements in fault isolation technologies.

Conclusion

Bi-Jen Chen's contributions to the field of integrated circuits through his innovative fault isolation systems demonstrate his commitment to advancing technology. His work not only enhances the efficiency of fault detection but also paves the way for future innovations in the industry.

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