Las Vegas, NV, United States of America

Bernard Timothy Meehan, Iii

This inventor holds 1 USPTO granted patent. Top assignee: National Security Technologies LLC. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bernard Timothy Meehan, Iii. Retrieved from https://idiyas.com/inventor/bernard-timothy-meehan-iii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Bernard Timothy Meehan, III: Innovator in Dense Plasma Focus Technology

Introduction

Bernard Timothy Meehan, III is a notable inventor based in Las Vegas, NV (US). He has made significant contributions to the field of plasma technology, particularly with his innovative designs and methods.

Latest Patents

Meehan holds a patent for a "Dense Plasma Focus Device and Method." This invention features an anode with a non-constant radius and a cathode that is also coupled to the anode, possessing a non-constant radius. The design allows for the anode and/or cathode to be tapered, and it maintains a constant inductance by keeping the ratio of the non-constant radii constant along the length of the device. Alternatively, the inductance can be varied by adjusting this ratio.

Career Highlights

Bernard Timothy Meehan, III is associated with National Security Technologies LLC, where he applies his expertise in plasma technology. His work has implications for various applications in the field of security and energy.

Collaborations

Meehan collaborates with Edward Christopher Hagen, contributing to advancements in their shared field of expertise.

Conclusion

Bernard Timothy Meehan, III is a distinguished inventor whose work in dense plasma focus technology showcases his innovative spirit and dedication to advancing scientific knowledge. His contributions continue to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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