This inventor holds 1 USPTO granted patent. Top assignee: National Research Council of Canada. Active years: 2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2003
Title: Benoit Reid: Innovator in Laser-Ultrasonic Measurement Technology
Introduction
Benoit Reid is a notable inventor based in Montreal, Canada. He has made significant contributions to the field of non-contact measurement technologies. His innovative work focuses on the characterization of thin sheets, particularly in industrial applications.
Latest Patents
Benoit Reid holds a patent for a method and apparatus titled "Laser-ultrasonic measurement of elastic properties of a thin sheet and of tension applied thereon." This invention provides a non-invasive way to characterize a moving thin sheet, such as a paper web on a production line. The method utilizes a laser to generate sonic and ultrasonic waves in the thin sheet, while a speckle insensitive interferometric device detects these waves. The process is designed to avoid damage to the sheet, ensuring its further use. When the generation and detection spots overlap, it measures the compression modulus. If the spots are separated by a known distance, it can measure the in-plane modulus and the tension applied to the sheet. By detecting waves in various directions, the method also determines the anisotropy of the in-plane modulus.
Career Highlights
Benoit Reid is affiliated with the National Research Council of Canada, where he continues to advance research in measurement technologies. His work has implications for various industries, particularly those involving thin materials.
Collaborations
Benoit has collaborated with esteemed colleagues such as Alain Blouin and Jean-Pierre Monchalin. Their combined expertise has contributed to the success of his innovative projects.
Conclusion
Benoit Reid's contributions to laser-ultrasonic measurement technology exemplify the impact of innovation in industrial applications. His work not only enhances measurement accuracy but also promotes efficiency in production processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile