The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2003
Filed:
Aug. 06, 2001
National Research Council of Canada, Ottawa, CA;
Abstract
A method and an apparatus for non-contact and non-invasive characterization of a moving thin sheet and in particular of a paper web on a production line. The method uses a laser for the generation of sonic and ultrasonic waves in the thin sheet and a speckle insensitive interferometric device for the detection of these waves. The generation is performed in conditions to avoid damage impeding further use of the sheet. When the generation and detection spots overlap, the method provides a measurement of the compression modulus. When the generation and detection spots are separated by a known distance and plate waves (Lamb waves) are generated and detected, the method provides a measurement of the in-plane modulus and of the tension applied to the sheet. By detecting waves propagating in various directions, either by rotating the detection sensor head or multiplexing the signals provided by several detection or generation locations, the anisotropy of the in-plane modulus is determined.