Castellet-lès-Sausses, France

Benoit Gubert

This inventor holds 1 USPTO granted patent. Top assignee: Xcerra Corporation. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Benoit Gubert. Retrieved from https://idiyas.com/inventor/benoit-gubert

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Benoit Gubert: Innovator in Test Socket Technology

Introduction

Benoit Gubert is a notable inventor based in Castellet-lès-Sausses, France. He has made significant contributions to the field of test socket technology, particularly through his innovative designs and patents. His work is characterized by a focus on enhancing the efficiency and effectiveness of testing devices.

Latest Patents

Benoit Gubert holds 1 patent for a "Test socket assembly with waveguide antenna probe." This invention includes a contactor body with a socket opening designed to receive a device under test. The assembly features one or more waveguides, which may be partially located within or external to the contactor body. Additionally, it incorporates at least one waveguide antenna probe that is coupled with the waveguides, enhancing the testing capabilities of the assembly.

Career Highlights

Benoit Gubert is currently employed at Xcerra Corporation, where he continues to develop innovative solutions in the field of testing technology. His expertise and dedication to his work have positioned him as a valuable asset to his team and the industry.

Collaborations

Benoit has collaborated with talented coworkers, including Dongmei Han and Yukang Feng. Their combined efforts contribute to the advancement of technology and innovation within their projects.

Conclusion

Benoit Gubert's contributions to test socket technology exemplify the spirit of innovation. His patent and ongoing work at Xcerra Corporation highlight his commitment to improving testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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