This inventor holds 2 USPTO granted patents and 3 published patent applications and 2 EPO patents. Top assignee: Renishaw Plc. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Benjamin George Hoy: Metrology and Articulated-Joint Innovations.
Introduction
Benjamin George Hoy is an inventor based in Wotton-under-Edge, Great Britain, whose work focuses on metrology apparatus and articulated joints. He is associated with Renishaw plc and has 2 patents listed in the information provided.
Latest Patents
Hoy’s listed inventions address the precision, verification, and operation of articulated joints used in metrology equipment.
The patent titled “Metrology apparatus” describes an indexed articulated joint with two bodies that can be locked together in different angular orientations. A verification sensor measures the bodies’ relative spatial configuration when locked. The apparatus compares that measurement with earlier calibration information for the same indexed position to help establish the state of engagement between the bodies.
The patent titled “Articulated member” describes a metrology apparatus with two bodies that can be locked in multiple angular orientations. A motor-actuated prop moves between a retracted position, where the bodies are locked, and an extended position, where they are held apart and can rotate relative to one another. Magnetic bias helps retain the bodies, while a supplemental bias member urges the prop toward its retracted position.
Career Highlights
Hoy’s listed patent work reflects an emphasis on improving the reliability and functionality of articulated components in metrology systems. The inventions combine mechanical positioning and retention features with sensing or actuation mechanisms.
Collaborations
Hoy is associated with Renishaw plc. His listed coworker is Andrew Geoffrey Butter.
Conclusion
Benjamin George Hoy’s two listed patents concern articulated-joint technologies designed to support accurate measurement, secure engagement, and controlled movement in metrology apparatus.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
