The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Feb. 16, 2022
Renishaw Plc, Wotton-under-Edge, GB;
Andrew Geoffrey Butter, Wotton-under-Edge, GB;
Benjamin George Hoy, Wotton-under-Edge, GB;
RENISHAW PLC, Wotton-under-Edge, GB;
Abstract
A metrology apparatus includes an indexed articulated joint including: first and second relatively reorientable bodies, respectively having mutually engageable engagement elements, which can be locked together in different angular orientations about a first axis to provide a plurality of angularly indexed positions of the bodies; at least one verification sensor configured to provide a measure of the relative spatial configuration of bodies when in their locked state; and wherein the apparatus is configured such that when the bodies lock together at an indexed position, the sensor measures the relative spatial configuration of the bodies, and wherein information obtained from the measure is compared to calibration information obtained from at least one other measure of the relative spatial configuration of the bodies when the bodies were locked at said indexed position at an earlier point in time, in order to establish information about the state of engagement of the bodies.