Grenoble, France

Benedikt Haas

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Commissariat a L'energie Atomique Et Aux Energies Alternatives. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Benedikt Haas. Retrieved from https://idiyas.com/inventor/benedikt-haas

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Benedikt Haas: Innovator in Electron Beam Technology

Introduction

Benedikt Haas is a notable inventor based in Grenoble, France. He has made significant contributions to the field of electron beam technology, particularly in methods for determining electric and magnetic fields.

Latest Patents

Haas holds a patent for a method of determining the deflection of an electron beam resulting from an electric field and/or a magnetic field. This innovative method involves illuminating a sample with an electron beam in precession mode, generating a diffraction pattern, and determining the local electric and magnetic fields, as well as the dielectric constant of materials.

Career Highlights

Throughout his career, Benedikt Haas has worked with prestigious organizations, including the Commissariat à l'énergie atomique et aux énergies alternatives. His work has focused on advancing the understanding of electron beam interactions with materials.

Collaborations

Haas has collaborated with notable colleagues such as David Cooper and Jean-Luc Rouviere, contributing to various research projects and innovations in his field.

Conclusion

Benedikt Haas is a distinguished inventor whose work in electron beam technology has paved the way for advancements in understanding electric and magnetic fields. His contributions continue to influence the scientific community.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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