Singapore, Singapore

Ben Ong

This inventor holds 1 USPTO granted patent. Top assignee: Chartered Semiconductor Manufacturing Ltd (Corporation). Active years: 2011.


Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ben Ong

Introduction

Ben Ong is a notable inventor based in Singapore, recognized for his contributions to semiconductor technology. He has developed a significant patent that enhances the fabrication of nitrogen-containing dielectric layers in semiconductor devices. His work is pivotal in advancing the efficiency and performance of electronic components.

Latest Patents

Ben Ong holds a patent titled "Method of fabricating a nitrogenated silicon oxide layer and MOS device having same." This innovative method involves creating a nitrogen-containing dielectric layer by forming a silicon oxide layer on a substrate. The process includes introducing nitrogen into the silicon oxide layer using nitrogen plasma, followed by annealing the layer. This technique allows for a bi-modal nitrogen concentration profile, optimizing the performance of semiconductor devices.

Career Highlights

Ben Ong is associated with Chartered Semiconductor Manufacturing Ltd, where he applies his expertise in semiconductor fabrication. His work has contributed to the development of advanced technologies in the semiconductor industry. With a focus on innovation, he continues to push the boundaries of what is possible in semiconductor manufacturing.

Collaborations

Throughout his career, Ben has collaborated with esteemed colleagues such as Jinping Liu and Zhengquan Zhang. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Ben Ong's contributions to the field of semiconductor technology through his patent and collaborative efforts highlight his role as a key innovator. His work not only advances the industry but also sets a foundation for future developments in semiconductor fabrication.

Profile summary based on public USPTO records.
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