Stockholm, Sweden

Ben Huber

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Prismatic Sensors Ab. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ben Huber. Retrieved from https://idiyas.com/inventor/ben-huber-cfptoakm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Ben Huber

Introduction

Ben Huber is a notable inventor based in Stockholm, Sweden. He has made significant contributions to the field of X-ray imaging technology. His work focuses on enhancing image reconstruction methods using advanced detection systems.

Latest Patents

Ben Huber holds a patent for an innovative method and system for X-ray imaging based on image data from a photon-counting multi-bin X-ray detector. This patent outlines a process that includes determining parameters of the relationship between comparator settings and energy threshold values. The method allows for efficient high-quality image reconstruction, which is crucial for medical imaging applications.

Career Highlights

Throughout his career, Ben Huber has been associated with Prismatic Sensors AB, where he has contributed to the development of cutting-edge imaging technologies. His expertise in X-ray detection systems has positioned him as a key player in the field.

Collaborations

Ben has worked alongside talented colleagues such as Mats Danielsson and Hans Bornefalk. Their collaborative efforts have further advanced the research and development of innovative imaging solutions.

Conclusion

Ben Huber's contributions to X-ray imaging technology exemplify the impact of innovative thinking in the medical field. His patent and collaborative work continue to influence advancements in imaging systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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