The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2018

Filed:

Nov. 10, 2014
Applicant:

Prismatic Sensors Ab, Stockholm, SE;

Inventors:

Mats Danielsson, Taby, SE;

Hans Bornefalk, Uppsala, SE;

Xuejin Liu, Taby, SE;

Ben Huber, Stockholm, SE;

Han Chen, Stockholm, SE;

Assignee:

PRISMATIC SENSORS AB, Stockholm, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); G01N 23/04 (2006.01); G01T 1/17 (2006.01); G01T 1/24 (2006.01); G01T 7/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/03 (2013.01); A61B 6/4241 (2013.01); A61B 6/482 (2013.01); A61B 6/5205 (2013.01); A61B 6/583 (2013.01); A61B 6/585 (2013.01); G01N 23/04 (2013.01); G01T 1/17 (2013.01); G01T 1/24 (2013.01); G01T 7/005 (2013.01); G06T 11/003 (2013.01); G06T 11/005 (2013.01);
Abstract

There is provided a method and corresponding system and apparatus for image reconstruction based on image data from a photon-counting multi-bin x-ray detector. The method includes determining (S) parameter(s) of a given functional form of the relationship between comparator settings expressed in voltage in the read-out chain of the x-ray detector and the corresponding energy threshold values expressed in energy based on a fitting procedure between a first set of data representative of a measured pulse height spectrum and a second set of data representative of a reference pulse height spectrum. The method also includes performing (S) image reconstruction based on the image data and the determined parameter(s). In this way, efficient high-quality image reconstruction can be achieved.


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