Raleigh, NC, United States of America

Ben Heilmann


Average Co-Inventor Count = 2.5

ph-index = 3

Forward Citations = 44(Granted Patents)


Company Filing History:


Years Active: 2007-2008

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5 patents (USPTO):Explore Patents

Title: The Innovations of Ben Heilmann

Introduction

Ben Heilmann is a notable inventor based in Raleigh, NC (US). He has made significant contributions to the field of temperature measurement and integrated circuit technology. With a total of 5 patents to his name, Heilmann's work reflects a commitment to advancing technological solutions.

Latest Patents

Heilmann's latest patents include innovative methods for ensuring accurate temperature measurements. One of his inventions, titled "Temperature update masking to ensure correct measurement of temperature when references become unstable," provides a method for updating temperature measurements using reference signals. This invention addresses the challenges posed by unstable references, ensuring reliable temperature readings. Another significant patent focuses on "Maintaining internal voltages of an integrated circuit in response to a clocked standby mode." This invention outlines a method for controlling output reference voltages in memory devices, enhancing their performance during standby modes.

Career Highlights

Heilmann is currently employed at Infineon Technologies AG, where he continues to develop cutting-edge technologies. His work at Infineon has positioned him as a key player in the semiconductor industry, contributing to advancements that impact various applications.

Collaborations

Heilmann collaborates with talented professionals in his field, including David Herbert and Torsten Partsch. These partnerships foster an environment of innovation and creativity, leading to the development of groundbreaking technologies.

Conclusion

Ben Heilmann's contributions to the field of technology through his patents and collaborations highlight his role as an influential inventor. His work continues to shape the future of temperature measurement and integrated circuit design.

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