This inventor holds 2 USPTO granted patents and 1 published patent application, plus 1 CIPO patent and 1 EPO patent. Top assignees: Nippon Steel Sumitomo Metal Corporation, Toyota Motor Engineering & Manufacturing North America, Inc., University of Kentucky Research Foundation. Active years: 2012-2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
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Years Active: 2012-2013
Title: Belal Gharaibeh: Innovator in Material Defect Detection
Introduction
Belal Gharaibeh is a notable inventor based in Lexington, KY (US). He has made significant contributions to the field of material defect detection, holding 2 patents that showcase his innovative approaches.
Latest Patents
His latest patents include a method for detecting defects in materials and a system for implementing this method. The first patent describes a technique for identifying defects on the surface or in the surface layer of a moving material. This method involves heating the material's surface, capturing thermal image data using an infrared thermography camera, and detecting defects by calculating the Laplacian concerning the temperature of the surface. The second patent focuses on analyzing thermal images of coated substrates to identify defects. This method determines a defect temperature range based on the color of the coated substrate and processes the thermal image to compare signal values of pixels to identify defect locations.
Career Highlights
Belal has worked with prominent organizations, including Toyota Motor Engineering & Manufacturing North America, Inc. and the University of Kentucky Research Foundation. His experience in these institutions has contributed to his expertise in material science and defect detection technologies.
Collaborations
He has collaborated with notable colleagues such as Kozo Saito and Keng Hoo Chuah, further enhancing his work in the field.
Conclusion
Belal Gharaibeh's innovative patents and career achievements highlight his significant contributions to material defect detection. His work continues to influence advancements in this critical area of technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile