The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2012
Filed:
Nov. 25, 2009
Richard Alloo, Lexington, KY (US);
Kozo Saito, Lexington, KY (US);
Belal Gharaibeh, Lexington, KY (US);
Keng Chuah, Lexington, KY (US);
Nelson Akafuah, Lexington, KY (US);
Ahmad Salaimeh, Lexington, KY (US);
Richard Alloo, Lexington, KY (US);
Kozo Saito, Lexington, KY (US);
Belal Gharaibeh, Lexington, KY (US);
Keng Chuah, Lexington, KY (US);
Nelson Akafuah, Lexington, KY (US);
Ahmad Salaimeh, Lexington, KY (US);
Toyota Motor Engineering & Manufacturing North America, Inc., Erlanger, KY (US);
University of Kentucky Research Foundation, Lexington, KY (US);
Abstract
A method of analyzing a thermal image of a coated substrate to determine the presence of defects includes determining a defect temperature range based on a color of the coated substrate and the maximum temperature of the coated substrate in the thermal image. Thereafter, the thermal image is processed by determining a signal value of a pixel of interest based on a temperature of the pixel of interest, temperatures of pixels in a kernel of pixels surrounding the pixel of interest, and the color of the coated substrate. The signal value of the pixel of interest is then compared to the lower temperature threshold of the defect temperature range, wherein the pixel of interest is a defect location when the signal value of the pixel of interest is greater than or equal to the lower temperature threshold.