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Title: Keng Hoo Chuah: Innovator in Material Defect Detection
Introduction
Keng Hoo Chuah is a notable inventor based in Lexington, KY (US). He has made significant contributions to the field of material defect detection, holding 2 patents that showcase his innovative approaches.
Latest Patents
His latest patents include a method for detecting defects in materials and a system for this method. The first patent describes a technique for identifying defects on the surface or in the surface layer of a moving material. This method involves heating the material's surface, capturing thermal image data using an infrared thermography camera, and detecting defects by calculating the Laplacian concerning the temperature of the surface. The second patent focuses on analyzing thermal images of coated substrates to identify defects. It determines a defect temperature range based on the color of the coated substrate and processes the thermal image to compare signal values of pixels to identify defect locations.
Career Highlights
Keng Hoo Chuah has worked with prominent organizations, including Toyota Motor Engineering & Manufacturing North America, Inc. and the University of Kentucky Research Foundation. His experience in these institutions has contributed to his expertise in material science and engineering.
Collaborations
Throughout his career, Keng has collaborated with notable colleagues such as Kozo Saito and Belal Gharaibeh. These partnerships have further enriched his research and development efforts.
Conclusion
Keng Hoo Chuah's innovative work in detecting material defects has made a significant impact in his field. His patents reflect his commitment to advancing technology and improving material analysis methods.