This inventor holds 1 USPTO granted patent. Top assignee: Vima Technologies, Inc.. Active years: 2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006
Title: Beitao Li - Innovator in Object Similarity Measurement
Introduction
Beitao Li is a notable inventor based in Goleta, California. He has made significant contributions to the field of measurement of similarity between objects. His innovative approach has led to the development of a unique patent that enhances the understanding of object relationships.
Latest Patents
Beitao Li holds a patent titled "Dynamic partial function in measurement of similarity of objects." This patent describes a method for measuring the similarity of a first object, represented by a first set of feature values, to a second object, represented by a second set of feature values. The method involves determining respective feature distance values between corresponding feature values of the two sets, selecting a subset of these values that are smaller in value, and summing them to produce a partial feature distance measure between the objects. This innovative technique provides a more refined approach to assessing object similarity.
Career Highlights
Beitao Li is currently employed at Vima Technologies, Inc., where he continues to work on advancing technologies related to object measurement and analysis. His expertise in this area has positioned him as a valuable asset to his company and the broader field of innovation.
Collaborations
Beitao collaborates with Edward Y Chang, a fellow innovator at Vima Technologies, Inc. Their partnership fosters a creative environment that encourages the development of groundbreaking ideas and solutions.
Conclusion
Beitao Li's contributions to the field of object similarity measurement exemplify the spirit of innovation. His patent and ongoing work at Vima Technologies, Inc. highlight his commitment to advancing technology and understanding in this important area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile