The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Sep. 24, 2002
Edward Y. Chang, Santa Barbara, CA (US);
Beitao LI, Goleta, CA (US);
Edward Y. Chang, Santa Barbara, CA (US);
Beitao Li, Goleta, CA (US);
VIMA Technologies, Inc., Santa Barbara, CA (US);
Abstract
A method of measuring similarity of a first object represented by first set of feature values to a second object represented by a second set of feature values, comprising determining respective feature distance values between substantially all corresponding feature values of the first and second sets of feature values, selecting a subset of the determined feature distance values in which substantially all feature distance values that are selected to be within the subset are smaller in value than feature distance values that are not selected to be within the subset, and summing the feature distance values in the subset to produce a partial feature distance measure between the first and second objects.
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