Berlin, Germany

Beatrix Fey

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Here Global B.v.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Beatrix Fey. Retrieved from https://idiyas.com/inventor/beatrix-fey

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Beatrix Fey: Innovator in Map Design Validation

Introduction

Beatrix Fey is a notable inventor based in Berlin, Germany. She has made significant contributions to the field of map design validation through her innovative approaches. Her work focuses on enhancing the accuracy and efficiency of map data generation.

Latest Patents

Beatrix Fey holds a patent for a "Method, apparatus, and system for providing mock map data for map design validation and documentation." This patent outlines an approach that involves calculating combinations of map feature attributes and creating geometric features based on these combinations. The method further includes determining the arrangement of these features within a designated geographic area and generating mock map data for rendering in a map image.

Career Highlights

Beatrix is currently employed at Here Global B.V., where she applies her expertise in map technology. Her innovative work has positioned her as a key player in the development of advanced mapping solutions.

Collaborations

Beatrix collaborates with Urban Velkavrh, who is also involved in the field of map technology. Their partnership enhances the creative and technical aspects of their projects.

Conclusion

Beatrix Fey's contributions to map design validation demonstrate her commitment to innovation in the field. Her patent and ongoing work at Here Global B.V. highlight her role as a leading inventor in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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