The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2025

Filed:

Nov. 29, 2021
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Urban Velkavrh, Berlin, DE;

Beatrix Fey, Berlin, DE;

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/00 (2006.01);
U.S. Cl.
CPC ...
G01C 21/387 (2020.08); G01C 21/3807 (2020.08); G01C 21/3833 (2020.08);
Abstract

An approach is provided for mock map data for map design validation. For example, the approach involves calculating one or more combinations of one or more map feature attributes, one or more map feature attribute values, or a combination thereof. The approach also involves creating one or more geometric features respectively for the one or more combinations. The approach further involves determining an arrangement of the one or more geometric features within a designated geographic area. The approach further involves generating mock map data based on the arrangement and providing the mock map data to a map client. The map client, for instance, renders the mock map data in a map image based on a map style taxonomy.


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