Eindhoven, Netherlands

Bastiaan Onne Fagginer Auer


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):

Title: The Innovator Behind Precision: Bastiaan Onne Fagginer Auer

Introduction:

Bastiaan Onne Fagginer Auer, a visionary inventor hailing from Eindhoven, NL, is making waves in the world of metrology with his groundbreaking patent.

Latest Patents:

Auer's notable patent titled "Method of processing data, method of obtaining calibration data" revolutionizes the way data from metrology processes is processed and calibration data is obtained. The patent involves analyzing measurement data obtained from illuminating a target on a substrate with measurement radiation, providing insights into the position and focus properties of radiation spots.

Career Highlights:

Auer currently serves as a key figure at ASML Netherlands B.V., a prominent player in the tech industry known for its cutting-edge innovations in semiconductor manufacturing.

Collaborations:

In his professional journey, Auer has had the pleasure of collaborating with talented individuals in the field, including Mariya Vyacheslavivna Medvedyeva and Maria Isabel De La Fuente Valentin. Together, they have contributed to pushing the boundaries of metrology technology.

Conclusion:

Bastiaan Onne Fagginer Auer's relentless pursuit of innovation and precision has established him as a trailblazer in the realm of metrology. His dedication to advancing data processing and calibration methodologies underscores his commitment to excellence in the field.

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